Non-Destructive Testing (NDT) / Materials Testing
FLIR cameras with Lock-In, Transient, and Pulse capability possess the ability to perform advanced inspections such as Non-Destructive Testing (NDT) or stress mapping that resolves temperature differences as low as 1 mK. NDT is a widely used method to evaluate the properties of a material, component or, system without causing damage. Thermal imaging cameras can detect internal defects through target excitation and the observation of thermal differences on a target's surface. It is a valuable tool for detecting defects and points of failure in composites, solar cells, bridges, and electronics. It is also a great tool for thermal mapping of stress when performing materials testing.