Non-destructive testing (NDT), advanced radiometry, electronic component design, and target signature characterizations all benefit from the X8580-HS InSb's high definition, 1280 × 1024 thermal sensor that detect small temperature differences with very little noise. Plus, the X8580-HS SLS—with its longwave, strained layer superlattice detector—offers shorter snapshot speeds so you can capture crisp stop motion images of high-speed events.
Zero Dropped Frames. Zero Compromises.
High-Speed, High Resolution
FLIR X-Series
Don't Lose a Moment of Critical Testing
In demanding environments such as scientific, defense, and aerospace research, critical testing events may only last a fraction of a second and missing data could prove costly. Having a high-performance infrared camera is therefore essential to capture and stream high-speed events flawlessly, ensuring no data loss and no dropped frames.
Introducing the FLIR X6980-HS and X8580-HS: the latest additions to the X-Series family. These high-speed, high-definition infrared cameras offer unmatched data streaming capabilities, guaranteeing zero dropped frames.
In fields where tests are expensive, losing even a single frame could mean missing crucial data.
Never Miss Crucial Data Again
Eradicate Data Loss and Dropped Frames
Record directly to the removable 4 TB solid-state drive (SSD) for extended periods of time at the fastest frame rate without dropping any frames.
Effortlessly Share Data
Simplified setup when recording directly to a PC with the latest 10 GigE, CXP 2.1, and CameraLink Full high-speed interfaces.
Record High-speed Events Precisely
Proprietary triggering, synchronization, and accurate IRIG time stamping system ensures precise on-time recording.
Motorized Lenses
FLIR has made the next generation of X-Series cameras compatible with its full suite of LWIR and MWIR motorized lenses. These cameras are custom-designed for optimal performance, enabling more precise and remote focus adjustments. They also integrate fully with Research Studio for enhanced control.
FLIR Research Studio
Research Studio provides users with a quick and efficient way to display, record, analyze, and report accurate thermal data. With a streamlined, intuitive GUI and unique feature set, users at all levels can effortlessly record and evaluate thermal data from multiple FLIR cameras and recorded sources simultaneously.
Choose the camera that’s right for your research
FLIR X8580-HS: High Definition Images, Fast Frame Rates
Talk to a FLIR expert for more information and to schedule a demonstration.
FLIR X6980-HS InSb™
- 640 × 512 热分辨率
- FLIR 锑化铟 (InSb) 探测器
- 1.5–5.0 µm 光谱范围
分辨率
640 × 512
探测器像素间距
25 µm
波长范围
1.5–5.0 µm
FLIR X6980-HS SLS™
- 640 × 512 热分辨率
- 应变层超晶格 (SLS) 探测器
- 7.5 µm（下限），11.5–12.5 µm（上限）光谱范围
分辨率
640 × 512
探测器像素间距
25 µm
波长范围
7.5 µm（下），11.5–12.5 µm（上）
FLIR X8580-HS InSb™
- 1280 × 1024 热分辨率
- FLIR 锑化铟 (InSb) 探测器
- 1.5–5.0 µm 光谱范围
分辨率
1280 × 1024
探测器像素间距
12 µm
波长范围
FLIR X8580-HS InSb、FLIR X8582-HS InSb：1.5 – 5.0 µm
FLIR X8581-HS InSb、FLIR X8583-HS InSb：3.0 – 5.0 µm
FLIR X8580-HS SLS™
- 1280 × 1024 热分辨率
- 应变层超晶格 (SLS) 探测器
- 7.5 µm（下限），11.5–12.5 µm（上限）光谱范围
分辨率
1280 × 1024
探测器像素间距
12 µm
波长范围
7.5 µm（下），11.5–12.5 µm（上）
分辨率
640 × 512
分辨率
640 × 512
分辨率
1280 × 1024
分辨率
1280 × 1024
探测器像素间距
25 µm
探测器像素间距
25 µm
探测器像素间距
12 µm
探测器像素间距
12 µm
波长范围
1.5–5.0 µm
波长范围
7.5 µm（下），11.5–12.5 µm（上）
波长范围
FLIR X8580-HS InSb、FLIR X8582-HS InSb：1.5 – 5.0 µm
FLIR X8581-HS InSb、FLIR X8583-HS InSb：3.0 – 5.0 µm
波长范围
7.5 µm（下），11.5–12.5 µm（上）
Resources & Support
